research.yurii.ch

Research

Papers, posters and tools from my work at the Institute of Electronics, TU Graz — mostly around nanoscale CMOS reliability, radiation effects, and the measurement systems that make them observable.

Papers

RADECS 2026Paper · accepted

Total Ionizing Dose Influence on Trapping Activities in Nanoscale CMOS

Yurii Chubenko, Semih Ramazanoglu, Alicja Michałowska-Forsyth

Continuous, in-situ monitoring of a single 40 nm transistor while the X-rays are still on — resolving discrete charge trapping and detrapping, and a rise in low-frequency noise that the usual before-and-after measurements miss.

Posters

MESS 2026Poster

Web-based Interactive Tool for Real-Time Analysis of Multi-day Nanoscale CMOS Defect Spectroscopy

Yurii Chubenko, Semih Ramazanoglu, Alicja Michałowska-Forsyth

The viewer I built to make sense of these runs: one web view that spans a five-day, terabyte-scale campaign and zooms down to a single ~25 nA trapping step, without pre-filtering or loading anything into memory first.