research.yurii.ch

Research

My work at the Institute of Electronics, TU Graz, covers radiation effects in nanoscale CMOS and the instruments and software I use to measure them. These pages describe the experiments and the tools I built.

Papers

RADECS 2026Paper

Total Ionizing Dose Influence on Trapping Activities in Nanoscale CMOS

Yurii Chubenko, Semih Ramazanoglu, Alicja Michałowska-Forsyth

We measured a single 40 nm transistor continuously during X-ray irradiation. The recordings show individual charge-trapping events and a rise in low-frequency noise that before-and-after measurements miss.

Posters

MESS 2026Poster

Web-based Interactive Tool for Real-Time Analysis of Multi-day Nanoscale CMOS Defect Spectroscopy

Yurii Chubenko, Semih Ramazanoglu, Alicja Michałowska-Forsyth

I built a browser-based viewer for five-day experiments producing terabytes of data. It shows the full run or individual charge-trapping steps at nanoampere and microsecond scales, without pre-filtering or loading the full dataset into memory.