RTN / TDDS measurement setup
WS 2025/26 – SS 2026 · Institute of Electronics, TU Graz
A custom acquisition system for characterising single-transistor defects under X-ray irradiation. A ping-pong oscilloscope configuration captures charge-trapping events; instrument control runs over VISA / HiSLIP / LXI, orchestrated by nine Python microservices, with a React/Vite dashboard and a Dash/Flask viewer.

- Noise floor
- 1100 pA @ 100 kHz
- Noise floor
- 100 pA @ 10 Hz
- Max run
- 2 days
- Anneal
- 150 °C
- Services
- 9 (scope · bias · adc · …)



